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Corrosion of Ga-doped Sn-0.7Cu Solder in Simulated Marine Atmosphere 期刊论文
Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science, 2013, 卷号: 44A, 期号: 3, 页码: 1462-1474
作者:  Z. Yan;  A. P. Xian
收藏  |  浏览/下载:116/0  |  提交时间:2013/12/24
Lead-free Solders  Electrochemical Corrosion  Whisker Growth  Nacl  Solution  Thin-films  Tin  Oxidation  Behavior  Alloys  
Microstructure and growth mechanism of tin whiskers on RESn3 compounds 期刊论文
Acta Materialia, 2013, 卷号: 61, 期号: 2, 页码: 589-601
作者:  C. F. Li;  Z. Q. Liu
收藏  |  浏览/下载:104/0  |  提交时间:2013/12/24
Intact Tin Whisker  Resn3 Compounds  In Situ  Transmission Electron  Microscopy (Tem)  Transmission Electron-microscopy  Pb-free Solders  Sn-cu  Surface  Technology  Joints  Bends  
The effects of temperature and humidity on the growth of tin whisker and hillock from Sn5Nd alloy 期刊论文
Journal of Alloys and Compounds, 2013, 卷号: 550, 页码: 231-238
作者:  C. F. Li;  Z. Q. Liu;  J. K. Shang
收藏  |  浏览/下载:120/0  |  提交时间:2013/12/24
Tin Whisker  Hillock  Ndsn3  Oxidation  Growth Mechanism  Lead-free Solder  Electron-microscopy  Nd Addition  Sn-whiskers  Joints  Mechanisms  
Surface Morphology of Sn-Rich Solder Interconnects After Electrical Loading 期刊论文
Journal of Electronic Materials, 2012, 卷号: 41, 期号: 4, 页码: 741-747
作者:  Q. S. Zhu;  H. Y. Liu;  Z. G. Wang;  J. K. Shang
收藏  |  浏览/下载:115/0  |  提交时间:2013/02/05
Solder Interconnect  Electromigration  Hillock  Grain Boundary Groove  Joints  Electromigration  Whisker  Copper  Tin  Cu  
In situ investigation on the oxidation behavior of a RESn(3) film by transmission electron microscopy 期刊论文
Scripta Materialia, 2011, 卷号: 65, 期号: 12, 页码: 1049-1052
作者:  C. F. Li;  Z. Q. Liu;  P. J. Shang;  J. K. Shang
Adobe PDF(528Kb)  |  收藏  |  浏览/下载:122/0  |  提交时间:2012/04/13
Resn(3) Compounds  Oxidation  Thermodynamics  Transmission Electron  Microscopy (Tem)  Pb-free Solders  Whisker Growth  Tin Whiskers  Surface  Joints  Alloys