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Microstructural stability of lamellar TiAl-based alloys at high temperature
G. L. Chen; L. C. Zhang; W. J. Zhang
1999
发表期刊Intermetallics
ISSN0966-9795
卷号7期号:11页码:1211-1218
摘要The microstructural stability of lamellar TiAl-base alloys at high temperature was studied by conventional and high-resolution transmission electron microscopy. This paper emphasized the influence of substructures on the thermal stability of lamellar structure. These substructures produced by thermal mechanical treatments include lattice dislocations and boundary dislocations, the subgrain boundaries, the impinged T (Q) twins and misorientated multi-ledges lamellar interface boundaries. Three dual-phase TiAl based alloys containing different type and density of substructures were produced by different thermomechanical treatments. The microstructural changes in these dual phase TiAl-base alloys were compared after exposure at 800-1000 degrees C. It was found that the existence of such substructures could accelerate the degeneration of lamellar structure, leading to the rapid necking and break-up of alpha(2) plates, the coarsening of gamma plates, and the formation of new gamma grains. A detailed description of various degeneration processes was given in the paper. As a result, the lamellar structure with heavy substructures started to degenerate after thermal exposure at 800 degrees C for 4.5 h. While only slight coarsening was observed at the colony boundaries in the lamellar structure without substructures even after exposure at 900 degrees C for 7 days. (C) 1999 Elsevier Science Ltd. All rights reserved.
部门归属univ sci & technol beijing, state key lab adv met & mat, beijing 100083, peoples r china. acad sinica, inst met res, atom imaging solids lab, shenyang 110015, peoples r china.;zhang, lc (reprint author), univ sci & technol beijing, state key lab adv met & mat, beijing 100083, peoples r china
关键词Titanium Aluminides Defects Defects Based On Tial Dislocation Geometry And Planar Faults Arrangement Alpha(2)/gamma Interfacial Structure Deformed Ti-45al-10nb Alloy Creep Resistance Deformation
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WOS记录号WOS:000082951600002
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被引频次:23[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.imr.ac.cn/handle/321006/37321
专题中国科学院金属研究所
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GB/T 7714
G. L. Chen,L. C. Zhang,W. J. Zhang. Microstructural stability of lamellar TiAl-based alloys at high temperature[J]. Intermetallics,1999,7(11):1211-1218.
APA G. L. Chen,L. C. Zhang,&W. J. Zhang.(1999).Microstructural stability of lamellar TiAl-based alloys at high temperature.Intermetallics,7(11),1211-1218.
MLA G. L. Chen,et al."Microstructural stability of lamellar TiAl-based alloys at high temperature".Intermetallics 7.11(1999):1211-1218.
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