On the length scale of cyclic strain localization in fine-grained copper films

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	On the length scale of cyclic strain localization in fine-grained copper films
	B. Zhang; K. H. Sun; Y. Liu; G. P. Zhang
	2010
发表期刊	Philosophical Magazine Letters
ISSN	0950-0839
卷号	90 期号:1 页码:69-76
摘要	Fine-grained copper films on a flexible substrate were cyclically deformed under constant strain range control. It was found that cyclic dislocation plasticity through individual dislocation glide is still dominant at the submicrometer scale, while the ability of irreversible slip of dislocations gradually decreases and the damage was changed from extrusion-induced localization to cracking along grain boundary. Statistical evaluation of the mean spacing between slip bands and/or lines leads to a critical scale (similar to 28 nm) below which dislocation-controlled cyclic strain localization would be shut down.
部门归属	[sun, k. h.; zhang, g. p.] chinese acad sci, inst met res, shenyang natl lab mat sci, shenyang 110016, peoples r china. [zhang, b.] northeastern univ, key lab anisotropy & texture mat, minist educ, sch met & mat, shenyang 110004, peoples r china. [liu, y.] seagate technol, fremont, ca 94538 usa.;zhang, gp (reprint author), chinese acad sci, inst met res, shenyang natl lab mat sci, 72 wenhua rd, shenyang 110016, peoples r china;gpzhang@imr.ac.cn
关键词	Cyclic Strain Localization Length Scale Fine Grain Metal Film Fatigue Mechanisms Damage Behavior Metals
URL	查看原文
WOS记录号	WOS:000273757100008
引用统计	被引频次：4[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.imr.ac.cn/handle/321006/31679
专题	中国科学院金属研究所
推荐引用方式 GB/T 7714	B. Zhang,K. H. Sun,Y. Liu,et al. On the length scale of cyclic strain localization in fine-grained copper films[J]. Philosophical Magazine Letters,2010,90(1):69-76.
APA	B. Zhang,K. H. Sun,Y. Liu,&G. P. Zhang.(2010).On the length scale of cyclic strain localization in fine-grained copper films.Philosophical Magazine Letters,90(1),69-76.
MLA	B. Zhang,et al."On the length scale of cyclic strain localization in fine-grained copper films".Philosophical Magazine Letters 90.1(2010):69-76.